<Record><identifier xmlns="http://purl.org/dc/elements/1.1/">URN:NBN:SI:DOC-96TF76BB</identifier><date>1994</date><creator>Metelko, Damir</creator><creator>Pejovnik, Stane</creator><relation>documents/doc/9/URN_NBN_SI_doc-96TF76BB_001.pdf</relation><relation>documents/doc/9/URN_NBN_SI_doc-96TF76BB_001.txt</relation><format format_type="issue">2</format><format format_type="volume">24</format><format format_type="type">article</format><format format_type="extent">str. 110-113</format><identifier identifier_type="ISSN">0352-9045</identifier><identifier identifier_type="COBISSID">109490944</identifier><identifier identifier_type="URN">URN:NBN:SI:doc-96TF76BB</identifier><language>slv</language><publisher>Strokovno društvo za mikroelektroniko, elektronske sestavne dele in materiale</publisher><source>Informacije MIDEM</source><rights>InC</rights><subject language_type_id="slv">elektrokemija</subject><subject language_type_id="slv">impedančna spektroskopija</subject><title>Impedančna spektroskopija</title></Record>