<Record><identifier xmlns="http://purl.org/dc/elements/1.1/">URN:NBN:SI:DOC-CEUL2V0A</identifier><date>2002</date><creator>Chaix, Jean-Marc</creator><creator>Popa, Ana Maria</creator><relation>documents/znanstveni_clanki/image_analysis_and_stereology/html/urn_nbn_si_doc-ceul2v0a.html</relation><relation>documents/znanstveni_clanki/image_analysis_and_stereology/pdf/urn_nbn_si_doc-ceul2v0a.pdf</relation><relation>documents/znanstveni_clanki/image_analysis_and_stereology/txt/urn_nbn_si_doc-ceul2v0a.txt</relation><format format_type="issue">2</format><format format_type="volume">21</format><format format_type="main">6 strani</format><format format_type="type">article</format><format format_type="extent">str. 133-138</format><identifier identifier_type="ISSN">1580-3139</identifier><identifier identifier_type="COBISSID">16032985</identifier><identifier identifier_type="URN">URN:NBN:SI:doc-CEUL2V0A</identifier><language>eng</language><publisher>Društvo za stereologijo in kvantitativno analizo slike, Medicinska fakulteta</publisher><source>Image analysis and stereology</source><rights>InC</rights><subject language_type_id="slv">analiza slik</subject><subject language_type_id="slv">Baker</subject><subject language_type_id="eng">Copper</subject><subject language_type_id="eng">Image Processing, Computer-Assisted</subject><subject language_type_id="slv">kompoziti</subject><subject language_type_id="eng">Microscopy, Electron, Scanning</subject><subject language_type_id="slv">Mikroskopija elektronska, vrstična</subject><subject language_type_id="slv">mikrostruktura</subject><subject language_type_id="eng">Porosity</subject><subject language_type_id="slv">Poroznost</subject><subject language_type_id="slv">Slika, obdelava z računalnikom</subject><subject language_type_id="eng">Tungsten Compounds</subject><subject language_type_id="slv">Volframove spojine</subject><subject language_type_id="slv">wolfram</subject><title>Quantitative image analysis of microstructure evolution during solid state sintering of W-Cu</title></Record>