<?xml version="1.0"?><rdf:RDF xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:edm="http://www.europeana.eu/schemas/edm/" xmlns:wgs84_pos="http://www.w3.org/2003/01/geo/wgs84_pos" xmlns:foaf="http://xmlns.com/foaf/0.1/" xmlns:rdaGr2="http://rdvocab.info/ElementsGr2" xmlns:oai="http://www.openarchives.org/OAI/2.0/" xmlns:owl="http://www.w3.org/2002/07/owl#" xmlns:rdf="http://www.w3.org/1999/02/22-rdf-syntax-ns#" xmlns:ore="http://www.openarchives.org/ore/terms/" xmlns:skos="http://www.w3.org/2004/02/skos/core#" xmlns:dcterms="http://purl.org/dc/terms/"><edm:WebResource rdf:about="http://www.dlib.si/stream/URN:NBN:SI:DOC-FM62GGS9/4dda1df3-afcf-47ba-ab24-8127872abfb4/PDF"><dcterms:extent>578 KB</dcterms:extent></edm:WebResource><edm:WebResource rdf:about="http://www.dlib.si/stream/URN:NBN:SI:DOC-FM62GGS9/850eec20-2e09-4f91-a171-123a730b6210/TEXT"><dcterms:extent>33 KB</dcterms:extent></edm:WebResource><edm:ProvidedCHO rdf:about="URN:NBN:SI:DOC-FM62GGS9"><dcterms:issued>2025</dcterms:issued><dc:creator>Kunaver, Matevž</dc:creator><dc:format xml:lang="sl">številka:2</dc:format><dc:format xml:lang="sl">letnik:55</dc:format><dc:format xml:lang="sl">str. 95-102</dc:format><dc:identifier>ISSN:0352-9045</dc:identifier><dc:identifier>DOI:10.33180/InfMIDEM2025.203</dc:identifier><dc:identifier>COBISSID_HOST:247998211</dc:identifier><dc:identifier>URN:URN:NBN:SI:doc-FM62GGS9</dc:identifier><dc:language>en</dc:language><dc:publisher xml:lang="sl">Strokovno društvo za mikroelektroniko, elektronske sestavne dele in materiale</dc:publisher><dc:source xml:lang="sl">Informacije MIDEM</dc:source><dc:subject xml:lang="en">circuit simulators</dc:subject><dc:subject xml:lang="sl">ekvivalentna električna vezja</dc:subject><dc:subject xml:lang="en">electrochemical impedance spectroscopy</dc:subject><dc:subject xml:lang="sl">elektrokemična impedančna spektroskopija</dc:subject><dc:subject xml:lang="en">equivalent electronic circuits</dc:subject><dc:subject xml:lang="sl">hipotetični elementi vezja</dc:subject><dc:subject xml:lang="en">hypothetical circuit elements</dc:subject><dc:subject xml:lang="sl">simulatorji vezij</dc:subject><dc:title xml:lang="sl">Introducing EIS circuit elements in SPICE simulator environment| Vpeljava elemementov ! EIS v SPICE simlator ! vezij|</dc:title><dc:description xml:lang="sl">This study introduces hypothetical circuit elements, specifically the Constant Phase Element (CPE) and Zeroth-Order Approximation of a RC Circuit (ZARC), into the SPICE circuit simulation environment to enhance Electrochemical Impedance Spectroscopy (EIS) analysis. EIS, a critical method for understanding electrochemical processes in fields such as fuel cell analysis, corrosion studies, and biomaterials, relies on fitting measured impedance curves to Equivalent Electrical Circuit (EEC) models. However, existing approaches require expert knowledge and significant mathematical effort, limiting automation. By integrating CPE and ZARC into SPICE, this work bridges the gap between EIS analysis and advanced automatic circuit design methodologies, enabling efficient model selection and parameter determination. Experimental results demonstrate the accuracy of the implemented elements through a series of case studies, evaluated using Sheppard’s criteria function. This integration marks a significant step toward automated EIS model fitting and optimization, with potential implications for advancing electrochemical and materials research</dc:description><dc:description xml:lang="sl">Ta študija uvaja hipotetične vezne elemente, specifično konstantnofazni element (CPE) in ničelni red približka RC vezja (ZARC), v simulacijsko okolje SPICE za izboljšanje analize elektrokemijske impedančne spektroskopije (EIS). EIS, ključna metoda za razumevanje elektrokemijskih procesov na področjih, kot so analiza gorivnih celic, študije korozije in biomateriali, temelji na ujemanju izmerjenih impedančnih krivulj z modeli ekvivalentnih električnih vezij (EEC). Obstoječi pristopi zahtevajo strokovno znanje in znatno matematično delo, kar omejuje avtomatizacijo. Z integracijo CPE in ZARC v SPICE to delo premošča vrzel med analizo EIS in naprednimi metodologijami samodejne zasnove vezij, kar omogoča učinkovito izbiro modelov in določanje parametrov. Eksperimentalni rezultati potrjujejo natančnost implementiranih elementov skozi serijo študij primerov, ocenjenih s pomočjo Sheppardove funkcije kriterijev. Ta integracija predstavlja pomemben korak proti avtomatiziranemu prilagajanju in optimizaciji modelov EIS, z možnimi vplivi na napredek raziskav na področju elektrokemije in materialov</dc:description><edm:type>TEXT</edm:type><dc:type xml:lang="sl">znanstveno časopisje</dc:type><dc:type xml:lang="en">journals</dc:type><dc:type rdf:resource="http://www.wikidata.org/entity/Q361785" /></edm:ProvidedCHO><ore:Aggregation rdf:about="http://www.dlib.si/?URN=URN:NBN:SI:DOC-FM62GGS9"><edm:aggregatedCHO rdf:resource="URN:NBN:SI:DOC-FM62GGS9" /><edm:isShownBy rdf:resource="http://www.dlib.si/stream/URN:NBN:SI:DOC-FM62GGS9/4dda1df3-afcf-47ba-ab24-8127872abfb4/PDF" /><edm:rights rdf:resource="http://creativecommons.org/licenses/by/4.0/" /><edm:provider>Slovenian National E-content Aggregator</edm:provider><edm:intermediateProvider xml:lang="en">National and University Library of Slovenia</edm:intermediateProvider><edm:dataProvider xml:lang="sl">Strokovno društvo za mikroelektroniko, elektronske sestavne dele in materiale</edm:dataProvider><edm:object rdf:resource="http://www.dlib.si/streamdb/URN:NBN:SI:DOC-FM62GGS9/maxi/edm" /><edm:isShownAt rdf:resource="http://www.dlib.si/details/URN:NBN:SI:DOC-FM62GGS9" /></ore:Aggregation></rdf:RDF>