<Record><identifier xmlns="http://purl.org/dc/elements/1.1/">URN:NBN:SI:DOC-MOYNFQMA</identifier><date>1995</date><creator>Koller, Lidija</creator><creator>Praček, Borut</creator><creator>Railič, Drago</creator><creator>Vrhovec, Stane</creator><relation>documents/doc/M/URN_NBN_SI_doc-MOYNFQMA_001.pdf</relation><relation>documents/doc/M/URN_NBN_SI_doc-MOYNFQMA_001.txt</relation><format format_type="issue">1</format><format format_type="volume">25</format><format format_type="type">article</format><format format_type="extent">str. 33-36</format><identifier identifier_type="ISSN">0352-9045</identifier><identifier identifier_type="COBISSID">17064709</identifier><identifier identifier_type="URN">URN:NBN:SI:doc-MOYNFQMA</identifier><language>eng</language><publisher>Strokovno društvo za mikroelektroniko, elektronske sestavne dele in materiale</publisher><source>Informacije MIDEM</source><rights>InC</rights><subject language_type_id="slv">analiza</subject><subject language_type_id="eng">Electronika</subject><subject language_type_id="slv">električni kontakti</subject><subject language_type_id="slv">elektronika</subject><subject language_type_id="slv">kontaktne površine</subject><subject language_type_id="slv">releji</subject><title>Analysis of contact layers in miniature electrical relays with Auger electron spectroscopy</title></Record>