<Record><identifier xmlns="http://purl.org/dc/elements/1.1/">URN:NBN:SI:DOC-UOV55SWC</identifier><date>2018</date><creator>Bendaoud, Abdelber</creator><creator>Benhadda, Nassireddine</creator><creator>Chikhi, Nawel</creator><relation>documents/doc/U/URN_NBN_SI_doc-UOV55SWC_001.pdf</relation><relation>documents/doc/U/URN_NBN_SI_doc-UOV55SWC_001.txt</relation><format format_type="issue">3</format><format format_type="volume">85</format><format format_type="type">article</format><format format_type="extent">str. 103-108</format><identifier identifier_type="ISSN">0013-5852</identifier><identifier identifier_type="COBISSID">13145603</identifier><identifier identifier_type="URN">URN:NBN:SI:doc-UOV55SWC</identifier><language>eng</language><publisher>Strokovna zadruga koncesijoniranih elektrotehnikov</publisher><source>Elektrotehniški vestnik</source><rights>InC</rights><subject language_type_id="slv">dioda</subject><subject language_type_id="slv">elektrotehnika</subject><subject language_type_id="slv">MOSFET</subject><subject language_type_id="slv">pretvornik DC/DC</subject><subject language_type_id="slv">prevodna elektromagnetna interferenca</subject><subject language_type_id="slv">tranzistor</subject><title>A conducted EMI noise prediction in DC/DC converter using a frequency-domain approach</title></Record>