Application of atomic force microscopy in preparing Ni-Al layer using a two-stage process

URN:NBN:SI:DOC-WW47KFHL2025Chen, XiHao, ZhenjieLi, NingningLi, YiminLing, ZichengPeng, JinTang, MingqiTong, YupingWei, LeyuXu, Leidocuments/doc/W/URN_NBN_SI_doc-WW47KFHL_001.pdfdocuments/doc/W/URN_NBN_SI_doc-WW47KFHL_001.txt259articlestr. 261–26610.17222/mit.2024.13521580-2949233964291URN:NBN:SI:doc-WW47KFHLengInštitut za kovinske materiale in tehnologijeMateriali in tehnologijeInCatomic force microscopymikroskopija na atomsko silomorfologijamorphologyNi-Al layernickel layerplast nikljatanke plasti na osnovi Ni-AlApplication of atomic force microscopy in preparing Ni-Al layer using a two-stage processUporaba mikroskopije na atomsko silo za pripravo Ni-Al tankih plasti z dvostopenjskim postopkom