<Record><identifier xmlns="http://purl.org/dc/elements/1.1/">URN:NBN:SI:DOC-XTTD9KNI</identifier><date>2013</date><creator>Beneš, Viktor</creator><creator>Král, Petr</creator><creator>Ponížil, Petr</creator><creator>Sklenička, Václav</creator><creator>Šedivý, Ondřej</creator><relation>documents/doc/X/URN_NBN_SI_doc-XTTD9KNI_001.pdf</relation><relation>documents/doc/X/URN_NBN_SI_doc-XTTD9KNI_001.txt</relation><format format_type="issue">2</format><format format_type="volume">32</format><format format_type="type">article</format><format format_type="extent">str. 65-75</format><identifier identifier_type="ISSN">1580-3139</identifier><identifier identifier_type="COBISSID">30796249</identifier><identifier identifier_type="URN">URN:NBN:SI:doc-XTTD9KNI</identifier><language>eng</language><publisher>Društvo za stereologijo in kvantitativno analizo slike, Medicinska fakulteta</publisher><source>Image analysis and stereology</source><rights>InC</rights><subject language_type_id="slv">baker</subject><subject language_type_id="slv">EBSD</subject><subject language_type_id="eng">electron backscatter diffraction</subject><subject language_type_id="eng">equal-channel angular pressing</subject><subject language_type_id="slv">metalografija</subject><subject language_type_id="eng">random marked sets</subject><subject language_type_id="eng">second-order analysis</subject><subject language_type_id="slv">statistična analiza</subject><subject language_type_id="slv">stereologija</subject><subject language_type_id="slv">uklon povratno sipanih elektronov</subject><title>Quantitative characterization of microstructure of pure copper processed by ECAP</title></Record>