12526 KB36 KB200020242013Beneš, ViktorKrál, PetrPonížil, PetrSklenička, VáclavŠedivý, Ondřejštevilka:2letnik:32str. 65-75ISSN:1580-3139COBISSID:30796249URN:URN:NBN:SI:doc-XTTD9KNIenDruštvo za stereologijo in kvantitativno analizo slike, Medicinska fakultetaImage analysis and stereologybakerEBSDelectron backscatter diffractionequal-channel angular pressingmetalografijarandom marked setssecond-order analysisstatistična analizastereologijauklon povratno sipanih elektronovQuantitative characterization of microstructure of pure copper processed by ECAP|Orientation imaging microscopy (OIM) allows to measure crystallic orientations at the surface of the material. Digitalized data representing the orientations are processed to recognize the grain structure and they are visualized in crystal orientation maps. Analysis of the data firstly consists in recognition of grain boundaries followed by identification of grains themselves. Knowing the grain morphology it is possible to characterize the homogeneity of the structure and estimate structural parameters related to the physical properties of the material. The paper describes methods of imaging and quantitative characterization of the grain boundary structure in metals based on data from electron backscattered diffraction (EBSD)TEXTznanstveno časopisjejournalsSlovenian National E-content AggregatorNational and University Library of SloveniaDruštvo za stereologijo in kvantitativno analizo slike