APA:
Danković, Danijel, Manić, Ivica, Prijić, Aneta, Davidović, Vojkan, Djorić-Veljković, Snežana, Golubović, Snežana, Prijić, Zoran, Stojadinović, Ninoslav (2013). Effects of static and pulsed negative bias temperature stressing on lifetime in p-channel power VDMOSFETs.
Informacije MIDEM, letnik 43, številka 1, str. 58-66.
URN:NBN:SI:DOC-9JI8BNOX from http://www.dlib.si
MLA:
Danković, Danijel, Manić, Ivica, Prijić, Aneta, Davidović, Vojkan, Djorić-Veljković, Snežana, Golubović, Snežana, Prijić, Zoran, Stojadinović, Ninoslav. "Effects of static and pulsed negative bias temperature stressing on lifetime in p-channel power VDMOSFETs."
Informacije MIDEM letnik 43. številka 1 (2013) str. 58-66.
<http://www.dlib.si/?URN=URN:NBN:SI:DOC-9JI8BNOX>