Stereology and 3D microscopy: useful alternatives or competitors in the quantitative analysis of microstructures? - Eckart Exner, Hans (Image analysis and stereology, 2004)
Keywords: Delec, velikost; Image Processing, Computer-Assisted; Microscopy, Electron; Mikroskopija elektronska; Particle Size; Slika, obdelava z računalnikom; analizne metode; mikrostruktura; mikroskopija; stereologija