Subthreshold modeling of triple material gate-all-around junctionless tunnel FET with germanium and high-K gate dielectric material - Lakshmi Priya, G. (Informacije MIDEM, 2018)
Keywords: brezspojni tunelski FET; germanij; germanium; high-K gate dielectric; hot carrier reliability; junctionless; podpragovni tok; vroči elektroni