APA:
Donnadieu, Patricia, Matsuda, Kenji, Epicier, Thierry, Douin, Joel (2001). Measurements of strain fields due to nanoscale precipitates using the phase image method.
Image analysis and stereology, volume 20, issue 3, str. 213-218.
URN:NBN:SI:DOC-KTYAR2B9 from http://www.dlib.si
MLA:
Donnadieu, Patricia, Matsuda, Kenji, Epicier, Thierry, Douin, Joel. "Measurements of strain fields due to nanoscale precipitates using the phase image method."
Image analysis and stereology volume 20. issue 3 (2001) str. 213-218.
<http://www.dlib.si/?URN=URN:NBN:SI:DOC-KTYAR2B9>